Asylum Research has released the NanoIndenter module to complement its MFP-3D atomic force microscope. Unlike cantilever-based indenters, the device drives the tip perpendicular to the sample. It enables measurement of tip displacement and force via the microscope’s optical detector and proprietary NPS nanopositioning sensors. Suitable for studying dislocation phenomena and the mechanical behavior of bone and other biomaterials, the module enables repeatable imaging, feature measurement, quantitative force curves and imaging offsets. It is available in standard- and low-force models, and it comes with small, medium and large sample mounts.