PEABODY, Mass., Aug. 5, 2010 — A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional and field-retrofittable cold FEG, the JEM-ARM200F’s ultrahigh imaging resolution is guaranteed at 78 pm with an energy resolution of 0.3 eV. The higher brightness and smaller source size of the cold FEG produce a smaller, sharper electron probe with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis. The narrow energy spread of the electrons emitted from the cold FEG enables atomic resolution analysis of electron energy-loss-spectroscopy fine structures, which can be used to determine such things as electronic properties. Ultrahigh vacuum near the electron source assures high stability of the electron probe current, while high electrical system stability of 10-7 maintains the very narrow energy spread of the electron probe. The addition of a cold FEG to the ARM family adds another dimension to the company’s capability for atomic scale imaging and characterization. This enhancement enables performance of subangstrom imaging and atomic column chemistry with accuracy, speed and ease. The ARM200F electron column integrates the cold FEG, scanning/scanning transmission electron microscope and Cs correction in an ultrastable design. Good shielding safeguards the ultrahigh-power optics from airflow, vibration, acoustical, magnetic, electronic and thermal interferences.