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  • InTouchScope SEM
Sep 2010
JEOL USA Inc.Request Info
PEABODY, Mass., Sept. 28, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy dispersive spectroscopy analysis with the latest silicon drift detector technology.

It has the feel of today’s personal electronic media. The intuitive multitouch screen interface puts all SEM apps at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.

Functions include automatic SEM condition setup based on sample type; simultaneous multiple live image and movie capture; easy sample navigation at 5× to 300,000× magnifications; quantitative and qualitative elemental analysis; low- and high-vacuum operation; and wireless capability.

High-vacuum resolution at 20 kV is 4 nm, at 3 kV, 8 nm, and at 1 kV, 15 nm. Low-vacuum resolution is 5 nm at 20 kV. Acceleration voltage is from 0.5 to 20 kV, and operating temperature is from -10 to 90 °C.

The company says that the microscope features all the capabilities of a full-size tungsten SEM in a small, ergonomic and intuitive design. An onboard turbo pump makes this a self-contained, portable SEM that is easy to set up anywhere in the laboratory.


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