A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional and field-retrofittable cold FEG, the JEM-ARM200F has ultrahigh imaging resolution that is guaranteed at 78 pm with an energy resolution of 0.3 eV. The higher brightness and smaller source size of the cold FEG produce a smaller, sharper electron probe with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis. The addition of a cold FEG to the ARM family adds another dimension to the company’s capability for atomic-scale imaging and characterization. This enhancement enables performance of subangstrom imaging and atomic column chemistry with accuracy, speed and ease.