Veeco Instruments Inc. has unveiled the Dimension Edge atomic force microscope (AFM) system for physical and life sciences applications. It features hardware and software advances that reduce the time required to produce expert-level data, providing a seamless path from sample placement through optical identification of the region of interest, and from AFM survey mode to zoomed-in feature identification. The proprietary closed-loop and drift-compensated stage combines productivity, accuracy and sample versatility with acquisition of high-resolution images. With low noise levels, the system enables collection of fine details critical for material identification, while protecting tips and samples and diminishing tip artifacts. A variety of AFM modes provides the accurate imaging and single-point spectroscopy capabilities required for characterization of solar and semiconductor devices, mapping of heterogeneous polymer-based materials, interrogation of individual nanoparticles and in situ imaging of life sciences samples from single molecules to whole cells.