MADISON, Wis., Oct. 20, 2010 — Thermo Fisher Scientific Inc. has launched a new version of its K-Alpha x-ray photoelectron spectrometer, a fully integrated, monochromated small-spot surface characterization tool designed for use by surface engineers working in research and development of new surface chemistries, or dealing with routine characterization of surfaces, thin films and coatings. Designed for a multi-user environment, it offers ease of operation and a streamlined workflow via the latest version of the proprietary Avantage acquisition and processing user interface. The spectrometer delivers increased count rates, faster analysis times and improved chemical detection for chemical surface characterization. Further enhancements include improvements to the sample viewing system, better automation, a tilt module for angular resolved x-ray photoelectron spectroscopy data collection, and a recirculating inert-gas glove box option for handling air-sensitive samples. The high level of integration between hardware and software enables users to calibrate the instrument with a single button press, and incorporates full traceability of all system parameters. The Avantage data system guides analysts through data acquisition, interpretation, processing and report generation. It offers full digital tool control while providing a comprehensive range of x-ray photoelectron spectrometry spectra and image processing routines. Customized laboratory reporting templates allow analysis reports to be easily exported to standard PC applications, such as Microsoft Office, at the click of a mouse. The new Avantage Indexer system provides quick and easy management of all stored data sets, enabling management by element, chemistry, acquisition date and other parameters.