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SIMS/SNMS Workstation

Photonics Spectra
Nov 2010
Hiden Analytical Ltd.Request Info
 
Hiden Analytical Ltd. has upgraded its SIMS/SNMS (secondary ion mass spectrometry/sputtered neutral mass spectrometry) workstation for high-sensitivity static and dynamic surface analysis. Applications range from photovoltaics, metallurgy, semiconductors and thin-film studies to geology and gemstone characterization. The sample loading and sample transfer stages with fast-entry load lock enable preloading and reloading of multiple samples for optimum cost-effective operational efficiency. The system is fully ultrahigh-vacuum-compliant, and with oxygen, argon and cesium ion sources, provides for broad-beam applications and fine-focus operation to a 20-μm spot size. It also offers elemental analysis of both electropositive and electro-negative species. Included in the system are electron beam charge compensation, a CCD camera and an enclosure. The multiported vacuum chamber is fully accessible for mounting additional accessories.


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GLOSSARY
camera
A light-tight box that receives light from an object or scene and focuses it to form an image on a light-sensitive material or a detector. The camera generally contains a lens of variable aperture and a shutter of variable speed to precisely control the exposure. In an electronic imaging system, the camera does not use chemical means to store the image, but takes advantage of the sensitivity of various detectors to different bands of the electromagnetic spectrum. These sensors are transducers...
mass spectrometry
An instrumental technique that utilizes the mass-to-charge ratio of charged particles as recorded from a mass spectrometer in order to determine the mass of a particle as well as the chemical makeup, or elemental ionic composition of a given sample or molecule.
spectrometry
The study and measurement of spectra and their components.
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