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  • Control Station

Photonics Spectra
Nov 2010
JPK Instruments AGRequest Info
JPK Instruments AG has Introduced the Vortis Advanced, a fully digital scanning probe microscope (SPM) electronics control system with low noise and high signal speed. It is available with all of the company’s SPM systems, enabling the NanoWizard 3, the ForceRobot 300 and the CellHesion 200 to deliver even better results. With fast signal acquisition and control, advanced feedback and analysis are the keys fora modular and ultraflexible controller. The lowest noise levels are achieved using a new grounding concept, intelligent signal conditioning, temperature-stabilized oscillators and passive cooling. The control station is supplied with a number of user-accessible analog and digital signal channels, fast responding lock-in amplifiers and high-end piezo drivers with closed-loop control.


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The transfer of a part of a device's or circuit's output back to its input.
lock-in amplifier
A form of synchronous detector having a balanced amplifier in which the signal is applied to the grids of two tubes as the control signal is applied to their plates or another grid. The difference in output currents is then measured.
An instrument consisting essentially of a tube 160 mm long, with an objective lens at the distant end and an eyepiece at the near end. The objective forms a real aerial image of the object in the focal plane of the eyepiece where it is observed by the eye. The overall magnifying power is equal to the linear magnification of the objective multiplied by the magnifying power of the eyepiece. The eyepiece can be replaced by a film to photograph the primary image, or a positive or negative relay...
scanning probe microscope
See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
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