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Rocky Mountain Instruments - Laser Optics LB

Control Station

Bruker Nano GmbH, JPK BioAFMRequest Info
 
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JPK Instruments AG has Introduced the Vortis Advanced, a fully digital scanning probe microscope (SPM) electronics control system with low noise and high signal speed. It is available with all of the company’s SPM systems, enabling the NanoWizard 3, the ForceRobot 300 and the CellHesion 200 to deliver even better results. With fast signal acquisition and control, advanced feedback and analysis are the keys fora modular and ultraflexible controller. The lowest noise levels are achieved using a new grounding concept, intelligent signal conditioning, temperature-stabilized oscillators and passive cooling. The control station is supplied with a number of user-accessible analog and digital signal channels, fast responding lock-in amplifiers and high-end piezo drivers with closed-loop control.


Published: November 2010
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CellHesion 200closed-loop controldigital scanning probe microscopefeedbackForceRobot 300JPK InstrumentsJPK Instruments AGlock-in amplifiermicroscopeMicroscopyNanoWizard 3New ProductsOpticspassive coolingpiezo driverscanning probe microscopesignal acquisitionsignal channelsignal conditioningSPMtemperature-stabilized oscillatorTest & MeasurementVortis Advanced

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