Request InfoWITec GmbHULM, Germany, Dec. 15, 2010 — WITec GmbH has launched the True Surface Microscopy option for topographic confocal Raman imaging applications. The core element of the imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining high confocality. With the new imaging mode, samples that had previously required extensive preparation...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics May/Jun 2023 IssueBandpass FiltersThe ADVANTECH™ hard coat bandpass filters from Andover Corp. offer steep slopes, high light transmission, durability, and long life for demanding applications. 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