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  • Microspectrophotometer
Feb 2011
CRAIC TechnologiesRequest Info
SAN DIMAS, Calif., Feb. 7, 2011 — The 20/20 Perfect Vision microspectrophotometer unveiled by Craic Technologies Inc. enables automatic imaging and measurement of spectra by absorbance, reflectance, fluorescence and emission, from the deep-ultraviolet to the visible to the near-infrared.

The fully programmable system is designed with touch-screen controls for automatic analysis of samples with UV-visible-NIR spectroscopy and microscopy. Applications include contamination analysis of hard disk components, thin-film measurement of semiconductors, microcolorimetry of flat panel displays, and quality control of pharmaceuticals. The microspectophotometer offers multiple spectroscopic techniques; high-resolution UV, color and NIR microscale imaging; and advanced automation for use in any laboratory or manufacturing facility.

The durable 20/20 PV microspectrophotometer integrates proprietary Lightblades spectrophotometer technologies with a custom-built UV-visible-NIR microscope and easy-to-use software. High-resolution digital imaging enables its use as an automated UV, color and NIR microscope. Sophisticated software, ranging from image analysis, spectral analysis, film thickness determination and colorimetry, enhances the capabilities of the system.


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The natural log of the ratio of absorbed intensity over the total intensity which gives a constant value assuming a stable volume as well as energy. In optical physics the absorbance may be defined as the absorption cross section multiplied by the absorbing material length.
Denoting the use of binary notation; i.e., the representation of data by bits (1 or 0).
The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
A specialized spectrophotometer for use through a microscope on very small areas of an object.
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
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