Map Surface Imaging/Metrology
Feb 2011Leica Microsystems GmbHRequest Info
WETZLAR, Germany, Feb. 8, 2011 — Leica Microsystems and Digital Surf have signed an agreement whereby Leica Map surface imaging and metrology software based upon Digital Surf's Mountains Technology will be used with the Leica Application Suite (LAS) for Leica industrial microscopes.
The new software is used to visualize and quantify features of measured surfaces, to characterize 3-D surface texture and geometry, and to generate visual surface metrology reports with full traceability. It is available on three levels with optional modules for advanced applications.
Entry level Leica Map Start software is used in conjunction with LAS Montage, which acquires a series of image planes at known spacing covering the in-focus region of a specimen with a Leica microscope. From this stack a depth map and an extended focus image are derived and analyzed by the software. Surface topography can be viewed at any zoom level and at any angle in real time. Color and intensity image overlays facilitate the location of surface features, including defects. Distances, angles and step heights can be measured. Height and functional parameters are calculated in accordance with the latest ISO 25178 standard on areal surface texture. Optional modules can extend the capability to surface texture and contour analysis.
Leica Map DCM 3D software is dedicated to the company’s dual-core 3-D microscope Leica DCM 3D, which combines confocal and interferometry technology for noninvasive, high-speed and high-resolution assessment of micro- and nanostructures. It offers the standard features of Leica Map Start and includes advanced ISO 16610 filtering techniques for separating surface roughness and waviness, basic functional analysis (bearing ratio, depth distribution) and the ability to extract subsurfaces from mechanical and electronic components and microelectromechanical systems, and to analyze them independently.
Leica Map Premium is a universal solution that is compatible with single-point tactile and optical profilometers and scanning probe microscopes, as well as with optical microscopes.
The software incorporates an enhanced desktop publishing environment to speed up complex calculations and the processing of large measurement data sets.