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  • Model 2061 Spectrometer
Feb 2011
McPhersonRequest Info
CHELMSFORD, Mass., Feb. 15, 2011 — McPherson Inc.’s high-resolution spectrometer for emission, luminescence, Raman (strained silicon) and high-temperature plasmas easily measures better than 0.02 nm full width half maximum spectra. Model 2061 is now available for scanning and imaging applications via two-dimensional CCD or CMOS detectors.

The 1-m focal length spectrometer features bilaterally adjustable slits, multiple entrance and exit port locations, and high-precision wavelength drive for good reproducibility. The ability to mount large, high-angle Echelle-type diffraction gratings is built in. The large, 50-mm-wide focal plane is readily accessible.

Oversize proprietary and patented Snap-In gratings provide a 40% more diffractive ruled area. Matching, focusing and collimating optics provide high light throughput and operation with an f/7 aperture. The gratings are easily interchangeable.

Many diffraction gratings are available to tailor systems for a wide spectral range or desired spectral resolution. Spectral resolution with a 10-µm entrance slit and a 1200 g/mm grating is better than 0.02 nm full width half maximum.


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A grating that serves to provide higher resolution and dispersion than the average grating, and still has a greater free spectral range than either the Fabry-Perot etalon or the reflection echelon.
See fluorescence; phosphorescence.
The successive analysis or synthesizing of the light values or other similar characteristics of the components of a picture area, following a given method.
A kind of spectrograph in which some form of detector, other than a photographic film, is used to measure the distribution of radiation in a particular wavelength region.  
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