Feb 2011McPhersonRequest Info
CHELMSFORD, Mass., Feb. 15, 2011 — McPherson Inc.’s high-resolution spectrometer for emission, luminescence, Raman (strained silicon) and high-temperature plasmas easily measures better than 0.02 nm full width half maximum spectra. Model 2061 is now available for scanning and imaging applications via two-dimensional CCD or CMOS detectors.
The 1-m focal length spectrometer features bilaterally adjustable slits, multiple entrance and exit port locations, and high-precision wavelength drive for good reproducibility. The ability to mount large, high-angle Echelle-type diffraction gratings is built in. The large, 50-mm-wide focal plane is readily accessible.
Oversize proprietary and patented Snap-In gratings provide a 40% more diffractive ruled area. Matching, focusing and collimating optics provide high light throughput and operation with an f/7 aperture. The gratings are easily interchangeable.
Many diffraction gratings are available to tailor systems for a wide spectral range or desired spectral resolution. Spectral resolution with a 10-µm entrance slit and a 1200 g/mm grating is better than 0.02 nm full width half maximum.