WiTec GmbH has launched the True Surface Microscopy option for topographic confocal Raman imaging applications. The core element of the imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows confocal Raman imaging along heavily inclined or very rough samples, with the true surface held in constant focus, while high confocality is maintained. With the new imaging mode, samples that previously required extensive preparation to obtain a certain surface flatness now can be easily and automatically characterized as they are. Complete system control and extensive data evaluation are integrated within the WiTec Control and WiTec Project software environment, guaranteeing ease of use.