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  • Pixis-XB Cameras
Apr 2011
Princeton InstrumentsRequest Info
TRENTON, N.J., April 7, 2011 — Princeton Instruments has launched the Pixis-XB series direct detection cameras designed for extremely low flux imaging and spectroscopy applications in the x-ray energy range between ~3 and 20 keV.

The cameras feature front- and back-illuminated deep-depletion CCDs with formats from 1340 × 400 to 1340 × 1300 pixels. They provide high sensitivity and a high dynamic range. They can run from a laptop computer with the USB 2.0 interface, and full triggering/shutter control capabilities are incorporated, operating at 100 kHz and 2 MHz.

The cameras are suited for medium x-ray applications such as photon correlation spectroscopy, intensity fluctuation spectroscopy, diffraction and lithography. They deliver deep cooling to better than -70 °C, achieved via a thermoelectric Peltier system, in a compact package offering ultrahigh vacuum with all metal seals and ultralow-noise electronics.

The instruments are configured with air or liquid cooling, available with the proprietary CoolCube liquid circulator, and are supplied with the WinView/WinSpec software suites. The macro record feature quickly and easily automates complex experiments. The camera line is also supported under LabView, with a suite of ready-to-use virtual instrument modules for full integration. Drivers that support the Linux operating system also are available.


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back-illuminated CCD
A CCD that has been reduced in thickness by etching so that light passes through the back layers of the CCD. This type of CCD typically has higher sensitivity, especially to blue light, and higher quantum efficiency than front-illuminated CCDs, because the light is not required to pass through the CCD's gate structure.
As a wavefront of light passes by an opaque edge or through an opening, secondary weaker wavefronts are generated, apparently originating at that edge. These secondary wavefronts will interfere with the primary wavefront as well as with each other to form various diffraction patterns.  
A mechanical or electronic device used to control the amount of time that a light-sensitive material is exposed to radiation.
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