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  • High-Power Test Meter
Apr 2011
Keithley Instruments Inc.Request Info
CLEVELAND, April 11, 2011 — Keithley Instruments Inc. has designed its high-power Model 2651A System SourceMeter for characterizing high-power electronics.

The instrument provides the widest current range available in the industry, according to the company. This is critical for a variety of R&D, reliability and production test applications, including the testing of high-brightness LEDs, power semiconductors, DC-DC converters, batteries and other high-power materials, components, modules and subassemblies.

As with each member of the Series 2600A family, Model 2651A offers a flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It combines the functionality of multiple instruments in a single full-rack enclosure: semiconductor characterization, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load and trigger controller.

It also is fully expandable into a multichannel, tightly synchronized system via the company’s TSP-Link technology, and it can source or sink up to 2000 W of pulsed power (±40 V, ±50 A) or 200 W of DC power (±10 V at ±20 A; ±20 V at ±10 A; ±40 V at ±5 A). It also can make precise measurements of signals as low as 1 pA and 100 μV at speeds up to 1 µs per reading.

The device provides a choice of digitizing or integrating measurement modes for precise characterization of both transient and steady-state behavior. Two independent analog-to-digital (A/D) converters define each mode — one for current and the other for voltage — which run simultaneously for accurate source readback without sacrificing test throughput.

The digitizing measurement mode’s 18-bit A/D converters allow capturing of up to 1 million readings per second for continuous 1 μs/point sampling, making this mode the most appropriate choice for waveform capture and for measuring transient characteristics with high precision. Competing solutions must average multiple readings to produce a measurement result and often don’t allow the measurement of transient behavior.

The integrating measurement mode, based on 22-bit A/D converters, optimizes the instrument’s operation for applications that demand the highest possible measurement accuracy and resolution. This ensures precise measurements of the very low currents and voltages common in next-generation devices.

Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50 to 100 A. The voltage range can be expanded from 40 to 80 V when two units are connected in series. The embedded Test Script Processor simplifies testing by allowing users to address multiple units as a single instrument. A built-in trigger controller synchronizes the operation of all linked channels to within 500 ns.

To minimize device self-heating during tests, a common problem with high-power semiconductors and materials, the instrument offers high-speed pulsing capabilities that allow users to source and measure pulses with high accuracy. Pulse widths from 100 ms to DC and duty cycles from 1 to 100 percent are programmable.


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