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LD8900 Goniometric Radiometers

Photonics.com
Oct 2011
Ophir - Spiricon LLC, PhotonicsRequest Info
 
LOGAN, Utah, Oct. 4, 2011 — Ophir Photonics Group’s patented LD8900 goniometric radiometer performs holographic materials measurement and can make X-Y and 3-D measurements without moving either the detector or the source. This allows the far-field profiler to characterize and confirm the divergence of light passing through holographic materials, such as those used for computer display screens, smartphones and instrument panels. The 3-D capability makes it possible to measure radially symmetrical divergences and angularly different types, addressing a wide range of finished materials.

Measuring diffusion materials is a challenging application that requires testing the consistency of divergence angles across large sheets. The LD8900 line of goniometric radiometers provides full 3-D measurements of the far-field pattern in <2 min, with better resolution than that produced by a CCD camera, according to the company.

The company's line of far-field profilers includes the LD8900 and LD8900R. The LD8900 has a dynamic range of >24 dB and the LD8900R, >36dB, providing greater detail in the “tails” of the far-field pattern. The LDR8900R also provides real-time measurements of mode field diameter in single-mode optical fibers. The angular field of view is 144°, with a resolution of 0.055°.

Besides measuring diffusion materials, the LD8900 can be used to measure laser diodes at any stage in their manufacture, from wafer to packaged product, and to optimize gradient index lenses.


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