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Tera-Lyzer Analysis Software

Photonics.com
Oct 2011
Menlo Systems GmbHRequest Info
 
MARTINSRIED, Germany, Oct. 13, 2011 — Menlo Systems GmbH is taking orders for Tera-Lyzer, the new terahertz (THz) data evaluation software developed by LyTera. The software enables advanced data analysis and brings terahertz time-domain spectroscopy (TDS) experiments to the next level.

The software is for the extraction of sample thickness, enabling investigation of sub-100-µm samples without the need for a differential measuring setup. Simultaneously, complex terahertz material parameters of the sample are determined, allowing for a variety of substances. Another feature enables analysis of multilayer systems in a standard THz-TDS setup and opens the door for a new range of experiments.

Menlo Systems’ experience in femtosecond-laser-based THz-TDS laboratory systems and LyTera’s background in the terahertz field offer a sound platform for customer-specific applications. TeraLyzer incorporates multistep procedures where, in a first step, the experimental THz-TDS data is imported into a time-domain preprocessor, minimizing jitter and amplitude drift-induced errors, removing signal offsets and offering windowing functionality. Then sample thickness is estimated, and the parameters (n, a, k, e’, e’’), along with error bars, are evaluated. Finally, thickness determination is performed by either of two algorithms considering Fabry Perot reflections: the Quasi Space or the Total Variation method. A variety of samples can be measured with high precision, even very thin ones.

Accurate thickness determination is possible, even if the sample is inaccessible; e.g., inside a cryostat. Highly absorbing samples can be measured because of dynamic range consideration. Versatile time-domain preprocessing features are included, such as flexible windowing, offset removal and phase correction. A free trial version is available upon request.


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