Request InfoBaumer Ltd.SOUTHINGTON, Conn., Nov. 1, 2011 — For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum. The company says that the cameras are twice as sensitive as monochrome technology at a wavelength of 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the integrity and effectiveness of each wafer prior to the next processing step. Structural...See full productRelated content from Photonics MediaPRODUCTSVision Spectra Autumn 2023 IssueCMOS Image SensorThe Snappy Wide 8K CMOS image sensor from Teledyne e2v is designed for logistics applications with large conveyor belts. 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Our...Photonics Buyers' GuideTeledyne DALSA, Machine Vision OEM ComponentsTeledyne DALSA is a part of Teledyne’s Vision Solutions group and a leader in the design, manufacture, and deployment of digital imaging components for machine vision. Teledyne DALSA image...