Search
Menu
LPC/Photonics.com - Stay-Up-To-Date

HXC20NIR and HXC40NIR Cameras

Facebook X LinkedIn Email
Request Info
Baumer Ltd.
SOUTHINGTON, Conn., Nov. 1, 2011 — For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum. The company says that the cameras are twice as sensitive as monochrome technology at a wavelength of 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the integrity and effectiveness of each wafer prior to the next processing step. Structural...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.