BERLIN, Dec. 9, 2011 — JPK Instruments has announced new quantitative imaging (QI) capabilities for the recently launched NanoWizard 3 atomic force microscopy (AFM) system. The QI mode was developed by the company to facilitate AFM imaging. With QI, a force curve-based imaging mode, the user has full control over the tip-sample force at every pixel of the image. There is no need for set point or gain adjustment while scanning. Applying proprietary ForceWatch technology, QI delivers good results on soft (hydrogels or biomolecules), sticky (polymers or bacteria), loosely attached (nanotubes or virus particles in fluid) samples, or on samples with steep edges (powders, microelectromechanical system structures). It is useful in areas that demand high resolution and force sensitivity, such as biology, polymers and surface science. The newly developed QI and QI-Advanced modes make the NanoWizard AFM a versatile instrument for high-end research and routine use. The company says that, compared with other imaging modes, QI not only performs imaging but also produces real quantitative data. Measuring a real and complete force distance curve at every pixel of the image yields all information about the local tip-sample interaction, and with high spatial resolution. The QI-Advanced software package is an extension of the standard version, enabling quantitative measurement of nanoscale material properties such as stiffness, adhesion and dissipation. The software is designed to be straightforward enough for a beginner to use while also offering advanced options to meet the needs of users who like to apply their own data processing routines.