THE WOODLANDS, Texas, Jan. 17, 2012 — Rigaku Corp. has announced additions to its MiniFlex series benchtop x-ray diffraction (XRD) analyzers. The fifth-generation MiniFlex is a general-purpose x-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. It is now available in two variations. Operating at 600 W (x-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, the company says, enabling faster analysis and improved overall throughput. Running at 300 W (x-ray tube), the MiniFlex 300 does not require an external heat exchanger and thus requires even less space. Each model is engineered to maximize flexibility in a benchtop package. Suited for today’s fast-paced XRD analyses, the new instruments deliver speed and sensitivity through technology enhancements such as the optional D/teX high-speed detector coupled with the new 600-W x-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. Incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, the instruments have an available sample changer. Whether teaching x-ray diffraction at the college and university level, or performing routine industrial quality assurance, the MiniFlex delivers performance and value. Each device is supplied standard with the latest version of PDXL, the company’s full-function powder diffraction analysis package. The latest version of PDXL offers a fundamental parameter method for more accurate peak calculation and for phase identification using the crystallography open database; it also provides a wizard for ab inito crystal structure analysis.