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Grazing Incidence Spectrometer

Photonics.com
Mar 2012
McPhersonRequest Info
 
CHELMSFORD, Mass., March 12, 2012 — McPherson Inc.’s grazing incidence spectrometer Model 248/310 enables users to make direct optical measurements from 1 to 300 nm, to test soft XUV high-energy light sources (plasma or laser) and samples and to measure lifetime, persistence and decay with continuous spectral scanning.

A normal scan with a diode or channel-electron multiplier-equipped instrument takes about 20 min. Users can resolve, clearly discern, record and store spectra and spectral events in the 1- to 300-nm scanning range. A new “up” scanning feature combines the 789A-3 digital drive and 248/310 spectrometer system accessories. Scan ranges can be programmed and preset, and investigation of spectral events in any wide or narrow range segment is programmable.

Users can analyze a hollow cathode discharge, or other plasma emission, for spectral content and decay within a preset scan range and can coordinate data collection at specific wavelengths with soft- or hardware triggers. The wavelength scan region can be set via software backed up by hardware. An optional adjustable end switch system is available.

The company’s vacuum spectrometers are available in focal lengths of 0.2 to ≥2 m. They are suitable for high-vacuum and equipped with all metal seals for ultrahigh-vacuum applications. Accessories such as light sources, detectors and sample chambers are offered.


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