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  • Imaging and Analysis System
Mar 2012
Phenom-World BVRequest Info
EINDHOVEN, Netherlands, March 28, 2012 — The Phenom proX all-in-one imaging and analysis system has been announced by Phenom-World for elemental analysis applications.

The embedded state-of-the-art energy-dispersive spectroscopy (EDS) detector does not require any additional cabling or customer setup, rendering installation and operation of the system seamless. Any feature can be imaged and analyzed without switching between PCs or systems.

Viewing 3-D images of microscopic areas solves only half the problem in an analysis. It is often necessary to identify the different elements associated with a specimen. EDS is an analytical technique that can evaluate x-rays that are generated by the specimen when bombarded by the Phenom CeB6 electron beam to identify its composition.

Scanning electron microscopy imaging of a sample from production can reveal contamination with an unknown substance or the inclusion of unknown particles. With the Phenom integrated x-ray analysis, these particles can be examined and their composition and potential origin revealed. X-ray analysis is also important when monitoring a production process that must create a consistent material mix or specific consistency of materials, such as the fabrication of alloys and ceramics.


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x-ray analysis
The series of processes used to identify and evaluate crystal structure by using crystalline solids to diffract x-rays. In the Laue method, radiation of a wide range of wavelengths is transmitted by an immobile crystal and the diffracted beams are captured as spots on a photographic plate. In other techniques, a monochromatic beam is incident on a crystal so rotated as to position the different atomic planes. The reflection is calculated by the ionization it produces or it is calculated on a...
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