Request InfoAMO WaveFront Sciences LLCWaveFront Sciences Inc. has introduced the Complete Light Analysis System - 2D, which provides quantitative measurements of both the intensity and phase of any optical source. This vibration-insensitive optical metrology tool is a low-cost baseline system with <l/100 resolution and >100-µm dynamic range. It is a complete, turnkey optical analysis system. Applications include beam profiling, quality control testing and screening, and on-line inspection. A portable version is also available.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra July 2023 Issue3D Metrology ScannerThe FreeScan Combo 3D metrology scanner from SHINING 3D Tech Co. Ltd. adopts metrology-grade accuracy, fine scanning, and high precision with a light, compact design. The system features blue...Photonics Spectra July 2023 IssueMetrology SystemThe MESO™ metrology solution from Imagine Optic is designed for at-wavelength testing of flat surfaces. 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