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  • eXcelon3 EMCCD Technology
Aug 2012
Princeton InstrumentsRequest Info
TRENTON, N.J., Aug. 10, 2012 — Princeton Instruments has introduced the next generation of its eXcelon technology for electron-multiplying (EM) CCDs. The eXcelon3 technology provides high sensitivity and improved fringe suppression.

In 2010, the company introduced advanced eXcelon CCD and EMCCD technology that improved the sensitivity of back-illuminated detectors across the spectrum from 200 to 1100 nm. It also reduced etaloning, the appearance of fringes attributable to constructive and destructive interference in a device’s back-thinned silicon while imaging in the NIR region from 750 to 1100 nm.

The next generation enhances the performance of EMCCDs in demanding low-light applications. Although traditional back-illuminated EMCCDs are capable of single-photon sensitivity, they lack sufficient quantum efficiency (QE) in the UV and NIR regions and suffer from etaloning in the NIR. New eXcelon3 reduces both limitations, making next-generation EMCCDs viable options for applications requiring broad UV-to-NIR sensitivity.

Detectors with eXcelon3 provide peak QE of ~95% at 650 nm and 1.1 to 2.5 times more sensitivity at specific wavelengths in the UV and NIR. They reduce peak-to-peak fringe amplitude to below 10%. The new sensors are available with proprietary Unichrome UV coating to enhance sensitivity below 350 nm.

The eXcelon3 technology is available in the company’s ProEM+ series of deep-cooled EMCCD cameras, with 512 × 512- and 1024 × 1024-pixel formats, and 1600 × 200 and 1600 × 400 for spectroscopy applications. The cameras target a variety of applications in the life sciences and physical sciences, including Bose-Einstein condensate imaging, astronomy, live-cell imaging, scanning confocal spectroscopy and single-molecule spectroscopy.


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The scientific observation of celestial radiation that has reached the vicinity of Earth, and the interpretation of these observations to determine the characteristics of the extraterrestrial bodies and phenomena that have emitted the radiation.
A phenomenon that degrades the performance of thinned, back-illuminated CCDs. The effect is caused by lightwaves passing through the CCD and reflected at the rear surface, producing interference fringes when they interact with incoming waves.
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