TRENTON, N.J., Aug. 10, 2012 — Princeton Instruments has introduced the next generation of its eXcelon technology for electron-multiplying (EM) CCDs. The eXcelon3 technology provides high sensitivity and improved fringe suppression. In 2010, the company introduced advanced eXcelon CCD and EMCCD technology that improved the sensitivity of back-illuminated detectors across the spectrum from 200 to 1100 nm. It also reduced etaloning, the appearance of fringes attributable to constructive and destructive interference in a device’s back-thinned silicon while imaging in the NIR region from 750 to 1100 nm. The next generation enhances the performance of EMCCDs in demanding low-light applications. Although traditional back-illuminated EMCCDs are capable of single-photon sensitivity, they lack sufficient quantum efficiency (QE) in the UV and NIR regions and suffer from etaloning in the NIR. New eXcelon3 reduces both limitations, making next-generation EMCCDs viable options for applications requiring broad UV-to-NIR sensitivity. Detectors with eXcelon3 provide peak QE of ~95% at 650 nm and 1.1 to 2.5 times more sensitivity at specific wavelengths in the UV and NIR. They reduce peak-to-peak fringe amplitude to below 10%. The new sensors are available with proprietary Unichrome UV coating to enhance sensitivity below 350 nm. The eXcelon3 technology is available in the company’s ProEM+ series of deep-cooled EMCCD cameras, with 512 × 512- and 1024 × 1024-pixel formats, and 1600 × 200 and 1600 × 400 for spectroscopy applications. The cameras target a variety of applications in the life sciences and physical sciences, including Bose-Einstein condensate imaging, astronomy, live-cell imaging, scanning confocal spectroscopy and single-molecule spectroscopy.