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Titan ETEM G2

Photonics.com
Aug 2012
FEI, North America NanoPortRequest Info
 
HILLSBORO, Ore., Aug. 13, 2012 — FEI has released the Titan ETEM G2, an environmental transmission electron microscope (ETEM) that enables time-resolved in situ studies of processes and materials exposed to reactive gases and elevated temperatures. Developers of energy and environmental products, such as catalysts, fuel cells and nanomaterials, can use it to study the relationships between structure and performance by observing atomic-scale processes and gas-solid interactions under conditions that mimic the operational environment.

Proprietary ChemiSTEM technology increases the speed of compositional analysis. The microscope extends TEM analysis to dynamic processes and interactions.

It helps researchers improve the performance of catalysts, such as those used to remove harmful components from automobile exhaust or to synthesize innovative nanomaterials. ETEM allows investigators to directly view changes in the atomic structure of individual nanoparticles as they interact with other atomic or molecular entities, or respond to changes in the temperature, pressure or composition of the gaseous environment.

ETEM’s ability to image and characterize individual nanoparticles complements the spatially averaging spectroscopy-based in situ techniques used in the industry, as well as experimental and theoretical surface science tools.

The Titan ETEM G2 can be fitted with an image corrector and proprietary X-FEG and monochromator technology. New features include a redesigned user interface that provides fast switching between ETEM and high-vacuum modes and full software control of all operational parameters. A differentially pumped objective lens, designed with a large pole piece gap, allows ample space for the gas inlet and full double tilt capability for 3-D tomography. The gas inlet system allows operators to safely add inert or reactive gases to the chamber at preset pressures from 10-3 Pa up to 2000 Pa (N2).

For more information, visit: www.fei.com/ETEM


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