Kelvin Probe Force Microscopy
Aug 2012Bruker Nano SurfacesRequest Info
SANTA BARBARA, Calif., Aug. 28, 2012 — Bruker Corp. has released the PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs).
It uses frequency-modulation detection to provide high-spatial-resolution Kelvin probe data. It builds on proprietary PeakForce Tapping technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. PeakForce KPFM provides automated parameter setup with ScanAsyst, improving quantitative surface potential data for materials research and semiconductor applications.
An optional addition available for the Dimension Icon and MultiMode 8 AFMs, it also includes the complete set of KPFM detection mechanisms (amplitude and frequency modulation) as well as the ability to perform KPFM measurements over an extended voltage range.
PeakForce KPFM mode enables more sensitive potential detection with optimized probes. It eliminates the contamination of FM-KPFM signals with mechanical crosstalk, retaining more accurate measurements even on samples with significant variation in adhesion or modulus. Those variations can be mapped simultaneously and independently at high spatial resolution using PeakForce QNM.