Dec 2012Tektronix Inc.
BEAVERTON, Ore., Dec. 27, 2012 — Tektronix Inc. has launched high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The PPG3000 pattern generators and PED3000 bit-error-rate detectors feature multichannel pattern generation with channel-specific data programming for margin testing on critical standards such as 100G Ethernet, which require up to four channels.
For testing coherent optical modulation formats such as DP-QPSK, the PPG3000, with its four phase-aligned channels, can be used in conjunction with the company’s OM4000 coherent light-wave signal analyzer to enable optical designers to optimize and validate coherent modulation formats in real time.
The PED3000 can be combined with the PPG3000 to provide up to 32-Gb/s bit-error-rate analysis with multichannel support for quick identification of crosstalk issues common in multilane data communications architectures. With the IEEE802.3ba standards test, designers can simulate a 4 × 28-G test bench to stress-test their receivers’ designs.
The PPG3000 series includes six models with 30- or 32-Gb/s speeds and with one, two or four channels. With features such as synchronized and phase-adjustable outputs and pseudo-random binary sequence or user-defined pattern generation, the instruments troubleshoot design issues.
- The measurable leakage of optical energy from one optical conductor to another. Also known as optical coupling.
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