Ultrafast Surface and Wavefront Measurement
Jan 2013TRIOPTICS GmbHRequest Info
WEDEL, Germany, Jan. 7, 2013 — The new µPhase PRO Workshop interferometer from Trioptics GmbH measures surface and wavefront aberrations in a matter of seconds.
The simple handling, the integrated alignment mode and the short measurement time create a device that is suitable for in-line measurement of plane and spherical samples.
Besides the visual fringe analysis, measurement/analysis software is available as an upgrade.