Search
Menu
BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

Focus in High-Resolution Microscopy

Applied Scientific Instrumentation Inc.Request Info
 
Facebook X LinkedIn Email
CRISP eliminates focus drift in microscopy by sensing submicron changes between the objective lens and the sample, and then providing a feedback signal to focus controllers. The CRISP system provides high-level focus stability, allowing a specimen to remain accurately focused indefinitely with a focus accuracy of 5% of the objective DOF, and also allowing focus to be maintained while scanning.


Published: January 2013
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Applied Scientific Instrumentation Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Applied Scientific InstrumentationASIBiophotonicsCRISPeliminate focus driftEuroPhotonics Product SpotlightFeatured Productsfocus stabilityImaginglensesMicroscopyOpticsPhotonics ShowcaseProduct Showcase

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.