Request Infopiezosystem jena GmbHJENA, Germany, Feb. 27, 2013 — piezosystem jena is offering the MIPOS 16-158 Z-axis positioner for high-precision positioning of optical systems with accuracy in the subnanometer range. The high resolution, fast response time, 158-mm aperture and stage height of 42 mm offer new possibilities for white-light interferometry. White-light interferometry is an effective method for 3-D surface measurement. Piezoelectric actuators improve accuracy and speed due to their high resolution and fast response time. The positioner produces a focus range up to 16 μm and single-step resolution of <0.1 nm, while operating in a...See full productRelated content from Photonics MediaPRODUCTSVision Spectra Autumn 2023 IssueSurface Inspection SystemThe ZEISS ABIS III is designed for reliable and early inspection of the entire component surface, within cycle time. 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