Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Email Facebook Twitter Google+ LinkedIn

  • LEXT OLS4100 3D Laser Scanning Microscope
Jun 2013
Olympus Europa SE & Co. KG, Medical Systems & Micro-Imaging Solutions GroupRequest Info
HAMBURG, Germany, June 3, 2013 — Olympus Europa’s new LEXT OLS4100 3-D laser scanning microscope analyzes a wide range of sample sizes and features a wide-field area map display of the sample under low magnification, making it suited for applications in optical metrology.

A single image can be constructed from many individual captures, which can then be viewed and measured in either 2-D or 3-D. The boundaries of the stitching area can be automatically detected, or the exact area can be manually specified by tracing around a sample of any shape.

By automatically adjusting for the Z-axis position, the Smart Scan mode restricts image acquisition to the focal plane for rapid scanning in high-resolution 3-D across large areas. Ultrafast mode is about nine times faster than Fine mode, and for even faster targeted acquisition of a specified area, the Band Scan mode will scan only the user-specified region instead of the whole sample.

Imaging through a variety of layers is possible with the new multilayer mode, which recognizes each separate layer as a distinct focal plane along the Z-axis.


* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.