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  • X-Y Scanning Stage
Aug 2013
Leica Microsystems AG, Industry Div.
HEERBRUGG, Switzerland, Aug. 2, 2013 — The LMT260 X-Y scanning stage from Leica Microsystems is compatible with stereo microscopes and macroscopes for use in time-lapse experiments such as mark and find, or for multiwall screenings.

At 5-nm resolution, the device offers repeatability of 0.25 µm for samples weighing <0.5 kg, and 1 µm for samples weighing 1.5 kg. Software includes the Leica Application Suite (LAS) and LAS Advanced Fluorescence to create a high-resolution picture from the several images the camera takes.

The stage’s magneto-resistive measurement system and two linear motors allow swift and quiet movement. Users also can move the stage manually, and the system does not require referencing after the stage has been initialized.

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