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S neox Optical Profiler

Photonics.com
Aug 2013
Sensofar MetrologyRequest Info
 
TERRASSA, Spain, Aug. 15, 2013 — Sensofar-Tech SL’s S neox optical profiler achieves vertical and lateral resolutions of 0.01 nm and 0.1 µm, respectively, using 3-D confocal and interferometry (phase shifting and vertical scanning) techniques in the same single-sensor head.

The instrument can acquire 3-D microscopy images as well as thickness measurements of any transparent coatings on the surface. Its high-resolution CCD sensor provides a 50% larger field of view compared with previous models, combined with high-resolution displays for sharp, crystal-clear and vivid images on-screen and without scaling.

For high-speed applications and low-reflective surfaces, full 3-D scans can be acquired in <3 s. New CF60-2 Nikon objective lenses provide a large working distance for each numerical aperture.

Applications include automated measurement and analysis tasks in production lines, and noninvasive assessments of the micro- and nanogeometry of technical surfaces in multiple configurations. The device is ISO 25178-compliant.


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GLOSSARY
interferometry
The study and utilization of interference phenomena, based on the wave properties of light.
optical profiler
Also known as a white-light interferometer. Measures surface texture and shape from nanometer-scale roughness to millimeter-scale step heights. A standard arrangement includes an illumination source, traditionally a tungsten-halogen bulb, coupled to an optical system with a variety of interferometric objectives.
vertical resolution
In television system specifications, the number of parallel horizontal black and white lines of equal thickness, that can be resolved from top to bottom of the raster. (One line equals either a black or white line.)
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