Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Email Facebook Twitter Google+ LinkedIn

  • Nexview 3-D Imaging and Surface Metrology System
Aug 2013
Zygo Corporation, Ultra Precision TechnologiesRequest Info
MIDDLEFIELD, Conn., Aug. 23, 2013 — Zygo Corp.’s Nexview 3-D imaging and surface metrology system offers subnanometer vertical resolution independent of magnification for the production and scientific research markets.

Able to operate on slopes up to 85° and in high-vibration environments, the profiler conducts noncontact surface metrology on a variety of surfaces, from very smooth to very rough, and safely measures fragile and transparent materials without altering the test surface. Proprietary Mx software produces high-fidelity surface topography maps for measuring roughness, flatness, angles, films, steps and more.

Other features include scanner-based crash protection; automated X-Y-Z and tilt staging; a 200-mm X-Y travel stage capable of 20-lb parts; a vertical travel of 100 mm; and an integrated head riser that can accommodate samples up to 160 mm tall.


* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.