JENA, Germany, Aug. 29, 2013 — Carl Zeiss Microscopy GmbH has introduced models 340 and 540 to its CrossBeam microscope series for use in 3-D nanotomography and nanofabrication applications in the materials and life sciences. Newly developed focused ion beam columns enable materials processing that can be observed with a field emission scanning electron microscope in real time. Adding a massive ablation laser allows access to deeply buried regions of interest. The CrossBeam 340’s variable-pressure column is suitable for in situ experiments with outgassing and charging specimens; CrossBeam 540 works with a double condenser system to process information more quickly, even at low voltage and high beam current. Materials scientists benefit from the 3-D analytics, the ability to image magnetic and nonconductive specimens, and the particular materials contrasts. Bioscientists can use the device for fast tomography series with high Z-resolution in cell and tissue biology. The system offers automated work flows for transmission electron microscopy lamella preparation. The open software can be used to integrate and automate the user’s applications. CrossBeam’s modular design makes it an open 3-D nanoworkstation that can be configured and field-upgraded for a broad spectrum of existing and potential applications.