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JSM-IT300LV Scanning Electron Microscope

Photonics.com
Sep 2013
JEOL USA Inc.Request Info
 
PEABODY, Mass., Sept. 10, 2013 — The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes.

The SEM extends vacuum pressure range to 10 to 650 pA; in low-vacuum mode, this enhances imaging capability for samples that are wet or oily, that outgas excessively or that are nonconductive without pretreatment.

The device features multiple ports for analytical attachments such as energy-dispersive x-ray spectrometers, electron backscatter diffraction, cathodoluminescence detectors, wavelength-dispersive x-ray spectrometers, chamberscopes and heating/cooling substages.

The vacuum chamber accommodates samples up to 300 mm in diameter and 80 mm in height. Sample navigation control, an embedded CCD camera and five-axis stage control allow accurate imaging and analyzing of samples at a wide range of angles and orientations.


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