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X6580sc Thermal Imaging Camera

Photonics.com
Oct 2013
FLIR SystemsRequest Info
 
MEER, Belgium, Oct. 31, 2013 — The X6580sc thermal imaging camera from Flir Systems Inc. provides ultrafast frame-rate acquisition for scientific and research applications involving dynamic thermal events.

The device features a 640 × 512 digital InSb detector with spectral sensitivity from 1.5 to 5.5 µm and a f/3 aperture. It provides images up to 350 Hz in full frame and up to 4500 Hz in a 320 × 8 subwindowing mode.

Features include high thermal sensitivity, snapshot imagery, a motorized spectral filter wheel and a detachable touch-screen LCD. The camera connects to the company’s ResearchIR Max 3 R&D software for thermal imaging data acquisition, analysis and reporting.

The camera can be temperature-calibrated up to 300 °C, or up to 3000 °C with spectral and/or neutral density filters, and it provides measurement accuracy of ±1 °C for standard configurations.


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