SANTA BARBARA, Calif., Nov. 11, 2013 — The nanoIR2 atomic force microscope (AFM) based spectroscopy platform from Anasys Instruments is suitable for measurements on a variety of sample types, including semiconductor devices, thin films, nanocomposites, data storage samples, minerals, tissue sections and polymer blends. The system operates with top-side illumination, eliminating the need to prepare samples on a ZnSe prism. It also features a resonance-enhanced mode that increases sensitivity and enables measurements on samples less than 20 nm thick. The platform combines the nanoscale spatial resolution of an AFM with the chemical characterization and identification capabilities of IR spectroscopy. Users can survey regions of a sample via AFM and then acquire high-resolution chemical spectra at the selected regions or acquire chemical images at a fixed wavelength.