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nanoIR2 IR Spectroscopy Platform

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Anasys Instruments Corp.
The nanoIR2 atomic force microscope (AFM) based spectroscopy platform from Anasys Instruments is suitable for measurements on a variety of sample types, including semiconductor devices, thin films, nanocomposites, data storage samples, minerals, tissue sections and polymer blends. The system operates with top-side illumination, eliminating the need to prepare samples on a ZnSe prism. It also features a resonance-enhanced mode that increases sensitivity and enables measurements on samples less than 20 nm thick. The platform combines the nanoscale spatial resolution of an AFM with...See full product

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