Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn

NanoWizard Ultra Speed AFM

Photonics.com
Dec 2013
JPK Instruments AGRequest Info
 
BERLIN, Dec. 12, 2013 — JPK Instruments AG’s next-generation NanoWizard Ultra Speed AFM (atomic force microscope) delivers fast scanning and superresolution on an inverted microscope for applications including the study of biological or other soft-matter systems.

The device provides real-time tracking changes in samples imaged in air or liquid. Its low-noise scanner, position sensor and detection system enable line-rate scanning speeds >100 Hz in closed-loop mode, while a proprietary Quantitative Imaging mode provides quantitative material property mapping.

A tip-scanning design and proprietary DirectOverlay mode allow the system to be fully integrated with an inverted optical microscope. Measurements can be made on single molecules or on living cells.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
GLOSSARY
inverted microscope
A microscope designed so that the specimen is located face down above the objective.
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.