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Non-contact Scanning Probe

Photonics.com
Jul 2014
Hexagon Manufacturing Intelligence
 
NORTH KINGSTOWN, R.I., July 15, 2014 — The HP-O Probe from Hexagon Metrology is a non-contact optical scanning probe that delivers force-free measurements on deformable parts and surfaces.

The device is based on frequency-modulated, interferometric optical distance measurement and is not affected by ambient light. It has a measurement range of up to 20 mm and repeatability of under 0.3 µm and has an acceptance angle of &plusmin;30 °. The probe can measure difficult-to-access features at a scanning speed of 1,000 points per second for rapid throughput.

The probe can be used to inspect metallic or sensitive part surfaces with mirror-like or polished finishes, eliminating the need to spray a part’s surface or measure blisks, blades, gear profiles and flank lines.


GLOSSARY
interferometry
The study and utilization of interference phenomena, based on the wave properties of light.
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