Jul 2014ON Semiconductor
PHOENIX, July 15, 2014 — A new CCD sensor from ON Semiconductor incorporates an improved amplifier design and optimized microlens structure for industrial imaging.
The KAI-08051 has a 5.5-µm pixel architecture, 8-megapixel resolution, 15 fps readout rate and a 4/3 optical format that improves light sensitivity, reduces read noise and improves color accuracy compared to previous generations.
The sensor is used for traffic imaging, surveillance, medical imaging and industrial inspection.
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