Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
SPECIAL ANNOUNCEMENT
2016 Photonics Buyers' Guide Clearance! – Use Coupon Code FC16 to save 60%!
share
Email Facebook Twitter Google+ LinkedIn

Film Thickness Measurement Software

Photonics.com
Oct 2014
CRAIC TechnologiesRequest Info
 
SAN DIMAS, Calif., Oct. 14, 2014 — Craic Technologies' FilmPro software can analyze a broad range of films on both transparent and opaque substrates and can be used with microspectrometers to measure the thickness of thin films via reflectance or transmission.

The software can measure thin-film thickness on semiconductors, microelectromechanical systems (MEMS), disk drives, flat-panel displays and more. Sampling areas can range from more than 100 µm across to <1 µm.

The software is designed for both research and production environments.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
GLOSSARY
reflectance
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2016 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.