IC Inspection System
Nov 2014Checkpoint TechnologiesRequest Info
SAN JOSE, Calif., Nov. 11, 2014 — The InfraScan ES400C-LW inspection system by Checkpoint Technologies can view emissions from 900 to 2500 nm, allowing photon emission and thermal imaging of integrated circuits using the same tool.
It can be equipped with an MCT camera, 3.3-NA solid immersion lens and a laser scanning microscope with passive, active and laser probing capabilities. It also offers optical debugging and failure analysis, and an optical filter wheel for customized emission regimes. The InfraScan ES400C-LW touts a 25 percent increase in optical resolution over previous models.