Request InfoCarl Zeiss Jena GmbHZeiss has announced new semiconductor inspection software, AutoAnalysis. The software provides fully automated analysis of aerial images in parallel to the measurements as they are being captured using the company’s AIMS (Aerial Image Measurement Software) systems. AutoAnalysis results are automatically entered into customized report layouts.See full productRelated content from Photonics MediaPRODUCTSVision Spectra Autumn 2023 IssueSurface Inspection SystemThe ZEISS ABIS III is designed for reliable and early inspection of the entire component surface, within cycle time. 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