Mar 20154D Technology Corp.Request Info
TUCSON, Ariz., March 5, 2015 — The AccuFiz Fizeau compact laser interferometer from 4D Technology Corp. allows accurate, repeatable measurement of surface shape and transmitted wavefront quality.
Designed for use in production environments and metrology labs, the device features long-range wireless remote control, motorized tip-tilt and a variable-sensitivity alignment system.
It offers wavelengths from 355 nm to 10.6 mu;m, apertures from 33 to 800 mm and horizontal and vertical mounting configurations. The device can be used to optimize for test conditions and reduce artifacts from dust, defects and stray reflections, resulting in low measurement noise.
The new Surface Isolation Source option adds a second, external laser source to measure plane-parallel optical surfaces, without the need for messy coatings or back-surface treatments to eliminate unwanted reflections. The external source can be used to measure the front and back surfaces, optical thickness, wedge and homogeneity of optical components. An operator can then switch easily to the internal source to measure a wide range of focal and afocal optics.