HAMBURG, Germany, March 17, 2015 — Olympus has expanded its DSX digital microscope series to enable faster measurement in manufacturing, quality assurance and application development applications. The series includes the wide-zoom DSX110 and two high-resolution systems, the upright DSX510 and the inverted DSX510i. Both high-resolution systems offer repeatable measurements along the X, Y and Z axes. Advanced stitching technology removes even the smallest artifacts. The extended focal imaging (EFI) function has been upgraded to nearly double the speed of 3-D image acquisition.