VIENNA, March 19, 2015 — A new system from Leica Microsystems facilitates correlative light and electron microscopy (CLEM). The EM Cryo CLEM system consists of the company’s DM6000 FS fluorescence light microscope with a cryogenic stage, cryo objective and a cryo transfer shuttle, as well as the first commercially available cryo CLEM objective to enable localizing of fluorescent-labeled target structures. The HCX PL APO 50× / 0,90 objective enables researchers to define fluorescent-labeled target structures up to 100 nm in size. It is apochromatically corrected and has an NA of 0.9. Its 0.28-mm working distance facilitates cryo imaging with a maximum resolution of 364 nm. The system allows rapid screening of large areas and determination of regions of interest that can be recognized in the electron microscope. This can reduce up to 50 percent of the user interaction on the cryo electron microscope and helps save time. Image data from both sources can be combined, resulting in a deeper understanding of the analyzed sample.