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Noncontact Surface Profiler

Photonics.com
Apr 2015
Taylor Hobson Ltd.Request Info
 
LEICESTER, UK, April 13, 2015 — Taylor Hobson CCI MP-LTaylor Hobson Ltd. has announced a new noncontact profiler for quantitative measurements of 3-D form and roughness features.

Based on coherence correlation interferometry (CCI) technology, the CCI MP-L provides nanometer resolution and a large field of view.

It features a 1024 × 1024-pixel array and a closed-loop, piezoless Z-axis scanner to provide a 500-μm vertical range.

The device can be used to measure wear, lubrication, corrosion, structured surfaces, medical implants, bearing roughness, crankshaft finish, textured steel, paper and toner.


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GLOSSARY
interferometry
The study and utilization of interference phenomena, based on the wave properties of light.
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