BELFAST, Northern Ireland, July 8, 2015 — Andor Technology Ltd. now offers extended-range, dual-antireflection technology on its iKon-L CCD camera platform for detection from the near-infrared (NIR) to UV. The technology broadens the sensitivity of back-illuminated, deep-depletion sensors through a dual antireflection coating process on enhanced silicon developed by e2v Technologies PLC of Chelmsford, U.K. It offers 90 percent or greater quantum efficiency in the 400- to 850-nm range. Fringe Suppression Technology ensures that etaloning is minimized in the NIR. iKon-L cameras cool large-area, 4-MP sensors to −100 °C using thermoelectric vacuum cooling, avoiding the aggravation of liquid nitrogen or compressed-gas cooling. Applications include exoplanet discovery, large-sky surveys and weak luminescence detection.